Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) for Polymer Characterization and Analysis

Mounting and Bonding the Labrum's Tip to the Atomic Force Microscopy (AFM) Tipless Cantilever Beam

For a silicon nitride AFM probe of radius 50 nm, calculate the ... | Filo

CONTPt - NanoWorld®

2.13 Recall that AFM can be used in force mapping mode to determine the local modulus of a cell. By rastering the AFM probe across the surface of the cell, an elasticity map can be obtained. As described in Section 2.5.1, if we model the AFM as a rigid, conical tip penetrating the soft, locally planar and linearly elastic cell, then the Hertz contact solution applies. For this situation, the penetration depth of the probe, uz, is related to the contact radius, a, by:u = -a * cot(arctan(a))(2.76)

Atomic force microscopy: Principle, instrumentation, useful applications - Chemistry Notes

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PinPoint Mode | How AFM Works - Principle of Atomic Force Microscopy on Make a GIF