Non-contact atomic force microscopy - Wikipedia
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy.
Non-contact vs. tapping mode • Both are based on a Feedback Mechanism of constant oscillation amplitude. • Non-contact mode: amplitude set as ~ 100% of “Free” amplitude; • Tapping mode: amplitude set as ~ 50 -60% of “Free” amplitude. • Tapping mode provides higher resolution with minimum sample damage. •
Noncontact atomic force microscopy: Bond imaging and beyond
2020年11月1日 · This dream was finally accomplished by the state-of-the-art noncontact atomic force microscopy (NC-AFM) equipped with qPlus force sensors and carbon monoxide (CO) functionalized tips. The resolved interconnectivity between atoms and molecules in NC-AFM frequency shift images is interpreted as chemical bonding, providing essential knowledge of ...
Noncontact Atomic Force Microscopy | SpringerLink
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface.
Non Contact Atomic Force Microscopy - ScienceDirect
Appealing as the traditional probes for formic acid chemistry may be, recent work with temperature programmed scanning tunneling microscopy (STM) and non-contact atomic force microscopy (NCAFM) has generated new interest in oxide surface science by dynamically illustrating surface diffusion and reaction of formates [8,24,56–60].
Atomic force microscopy - Wikipedia
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Noncontact Atomic Force Microscopy: Volume 3 | SpringerLink
Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
Noncontact Atomic Force Microscopy: An Emerging Tool for …
2015年8月24日 · The reason is that common AFM operating modes do not provide the atomic resolution required to follow catalytic processes; rather the more complex noncontact (NC) mode is needed. Thus, scanning tunneling microscopy has been the principal tool for atomic scale catalysis research.
AFM, Non-contact Mode - SpringerLink
The NC-AFM technique is the method of choice to obtain true atomic resolution on non-conduction surfaces with an atomic force microscope.
Generation, manipulation and characterization of molecules by atomic …
2017年1月11日 · Atomic force microscopy. Non-contact AFM is the most important technique for structure elucidation, because it enables atomic resolution on molecules 12 and its contrast mechanisms are well...
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