AFM image artifacts - ScienceDirect
2014年6月15日 · In this paper, we discuss the most frequently encountered image artifacts in atomic force microscopy. A variety of artifacts are illustrated by the results obtained with the aid of contact AFM (C-AFM), which can help avoid misinterpretations.
AFM Scanning Parameters and Image Artifacts - GitHub Pages
2021年4月7日 · Right now, I want to talk about two related aspects of AFM imaging: how to optimize your scanning parameters, and what common image artifacts you should look out for while you’re imaging. Let’s get to it! I will start by introducing some of the parameters we commonly tune during AFM imaging, and then I will describe each in more detail below.
How to Recognize and Avoid AFM Image Artifacts
Artifacts can originate from the probe tip geometry, scanner non-linearity, image processing software, vibration, sample contamination, electronic noise, and poor sample stability. This article describes and illustrates common AFM image artifacts and suggests means to eliminate or …
Experienced AFM users as well as novices can benefit from considering the sources of AFM artefacts, as some artefactual features are very subtle, and can only be clearly seen when making particular measurements from an image (for example when measuring line profiles, or Fourier filtering). This chapter contains examples of common AFM artefacts,
Images taken with the atomic force microscope (AFM) originate in physical interactions that are totally different from those used for image formation in conventional light and electron microscopy. One of the effects is that a new series of artifacts can appear in images that may not be readily recognized by users accustomed to conventional ...
Artifacts in AFM - SpringerLink
2019年5月24日 · If the tip has a broader shape, artifacts occur due to a convolution of the tip shape with the surface features. Nearby micro tips can lead to a doubling of surface features in the acquired AFM image. Other kinds of artifacts in atomic force microscopy [1,2,3] include thermal drift, feedback overshoot, piezo creep, and electrical noise. While ...
Recognizing and avoiding artifacts in atomic force microscopy imaging
Atomic force microscopy (AFM) measurements could be affected by different kinds of artifacts; some of them derive from the improper use of the instrument and can be avoided by setting the correct experimental parameters and conditions. In other cases, distortions of the images acquired by AFM are in …
(B) AFM image of the test pattern. Because the probe is not sharp, the test pattern squares appear much smaller than they should. The features in the AFM image appear as rectangles and not as squares. Figure 5 This “chipped” AFM probe follows the geometry of the sam-ple surface and creates an image with a substantial artifact.
Chapter 6 AFM image artefacts | Atomic Force Microscopy
2010年3月31日 · Identifying the artefacts so that they can be explained and excluded from analysis is one of the most difficult tasks facing new AFM users. This chapter explains the origins of the artefacts that occur in AFM images, and explains what can be done to avoid them. All measurements and measurement techniques are prone to artefacts.
AFM Artifacts List - AFMHelp.com
2009年8月10日 · There are many different artifacts that can appear in AFM images. On these pages, I give some examples of what they look like to help you spot them and describe, where possible, how to avoid the artifact.